整体式涂层测厚仪

Elcometer 456整体式涂层测厚仪

参考价: 面议

具体成交价以合同协议为准
2022-05-23 11:10:03
590
产品属性
关闭
上海首立实业有限公司

上海首立实业有限公司

初级会员1
收藏

组合推荐相似产品

产品简介

Elcometer 456整体式(内置)探头适合测量平、曲形表面。单手操作、无需连线,"大脚"探头可测得重复、*的结果。

详细介绍

Elcometer 456整体式涂层测厚仪适合测量有机、无机涂层厚度,基体类型有:
  • 铁基(F)
  • 非铁基(F)或
  • 铁基及非铁基(FNF)
上一篇:电子天平结构原理 下一篇:1T铸铁砝码的技术标准介绍
提示

请选择您要拨打的电话:

27193 [{"ID":"747768","CompanyID":"48414","Title":"电子天平结构原理","Picture":"","PictureDomain":"","UpdateTime":"2024/9/28 7:55:43","CreateTime":"2024/9/28 7:55:43","ClassName":"技术交流","rn":"3"},{"ID":"744725","CompanyID":"74496","Title":"1T铸铁砝码的技术标准介绍","Picture":"","PictureDomain":"","UpdateTime":"2024/9/9 7:12:09","CreateTime":"2024/9/9 7:12:09","ClassName":"技术交流","rn":"4"}]